@ARTICLE{Piecek_W._Refractive_2016, author={Piecek, W. and Jaroszewicz, L.R. and Miszczyk, E. and Raszewski, Z. and Mrukiewicz, M. and Perkowski, P. and Nowinowski-Kruszelnicki, E. and Zieliński, J. and Olifierczuk, M. and Kędzierski, J. and Sun, X.W. and Garbat, K. and Kowiorski, K. and Morawiak, P. and Mazur, R. and Tkaczyk, J.}, volume={vol. 24}, number={No 4}, journal={Opto-Electronics Review}, pages={169-182}, howpublished={online}, year={2016}, publisher={Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of Technology}, abstract={There exists a need in a quality and accuracy of a three-dimensional laser metrology operating in numerically controlled automatic machines. For this purpose, one sends three laser beams mutually perpendicular. These three beams of the wavelength λ = 0.6328 μm are generated by the same laser and are directed along three independent, orthogonal, mutually perpendicular, optical paths with a given light polarization plain. Using these beams, constituting the frame of coordinates, three independent laser rangefinders are able to determine spatial coordinates of a working tool or a workpiece. To form these optical pulses, a special refractive index matched Half-Wave Plate with nematic Liquid Crystal (LCHWP) was applied. The presented half-wave plate is based on a single Twisted Nematic (TN) cell (with the twist angle Φ = π/2) of a rather high cell gap d ~15 μm filled with a newly developed High-Birefringence Nematic Liquid Crystal Mixture (HBLCM) of optical anisotropy as high as Δn ~0.40 at λ = 0.6328 μm, where the Mauguin limit above 5.00 ~ Δnd >> λ/2 = 0.32 is fulfilled.}, type={Article}, title={Refractive index matched half-wave plate with a nematic liquid crystal for three-dimensional laser metrology applications}, URL={http://czasopisma.pan.pl/Content/116104/PDF/Opto2016_22.pdf}, keywords={liquid crystal, half-wave plate, twisted nematic, laser metrology}, }