TY - JOUR N2 - This paper introduces a new comprehensive procedure for both geometric and colour calibration of structured light system. In order to perform both geometric and colour calibration procedure, a new calibration artifact is proposed. The intrinsic and extrinsic parameters of projector and camera are estimated by using an extended pinhole camera model with a tangential and radial distortion. Camera image plane coordinates are obtained by extracting features from images of a calibration artifact. Projector image plane coordinates are calculated on the basis of continuous phase maps obtained from a fringe pattern phase reconstruction procedure. In order to stereo calibrate camera-projector system, pairs of corresponding image plane points are calculated with subpixel accuracy. In addition, one of three pattern views is used in colour calibration. RGB values of a colour field pattern detected by camera and their reference values are compared. This comparison leads to derivation of a colour transformation matrix. The performance of the proposed method is tested by measuring plane, sphere and distance reference. Also 360 degrees complex object 3D model from a set of measurements is obtained. Residual mean errors for all tests performed are calculated. L1 - http://czasopisma.pan.pl/Content/115387/PDF/main.pdf L2 - http://czasopisma.pan.pl/Content/115387 PY - 2017 IS - No 4 EP - 336 KW - Structured light KW - Colour calibration KW - Geometric calibration KW - Low cost scanner KW - Simple calibration A1 - Szelag, K. A1 - Maczkowski, G. A1 - Gierwialo, R. A1 - Gebarska, A. A1 - Sitnik, R. PB - Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of Technology VL - vol. 25 DA - 09.11.2017 T1 - Robust geometric, phase and colour structured light projection system calibration SP - 326 UR - http://czasopisma.pan.pl/dlibra/publication/edition/115387 T2 - Opto-Electronics Review ER -