TY - JOUR N2 - In this work, we present an extensive investigation of the effect of Al2O3 decoration on the morphological, structural and opto-electronic properties of a porous Si (Sip)/Cr2O3 composite. The Sip layers were prepared by the anodization method. Al2O3 and Cr2O3 thin films were deposited by physical vapour deposition. The morphological and micro-structural properties of Sip/Cr2O3/Al2O3 were studied using the scanning electron microscope, energy dispersive X-ray spectroscopy and X-ray diffraction techniques. It was found that Al2O3 decoration with different concentration strongly affects the Sip/Cr2O3 microstructure mainly at the level of porosity. Variable angle spectroscopic ellipsometry demonstrates a strong correlation between optical constants (n and k) of Sip/Cr2O3/Al2O3 and microstructure properties. Dielectric properties of Sip/Cr2O3/Al2O3 such as electrical conductivity and conduction mechanism were explored using impedance spectroscopy over the temperature interval ranging from 340 to 410°C. A semiconductor to the metallic transition has been observed at high frequency. L1 - http://czasopisma.pan.pl/Content/116801/PDF-MASTER/OPELRE_28_2020_M_GHRIB.pdf L2 - http://czasopisma.pan.pl/Content/116801 PY - 2020 IS - 3 EP - 163 DO - 10.24425/opelre.2020.133673 KW - Cr2O3/Al2O3 KW - porous Si KW - microstructure KW - optical and electrical properties A1 - Ghrib, M. A1 - Tlili, B. A1 - Razeg, M. A1 - Ouertani, R. A1 - Gaidi, M. A1 - Ezzaouia, H. PB - Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of Technology VL - 28 DA - 11.08.2020 T1 - Effect of Al2O3 decoration on the opto-electrical properties of a porous Si/Cr2O3 composite SP - 155 UR - http://czasopisma.pan.pl/dlibra/publication/edition/116801 T2 - Opto-Electronics Review ER -