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Number of results: 4
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Abstract

This paper mainly concentrates and discusses on sugarcane crop, the variety of cane seeds available for sowing; various cane diseases and its early detection using different approaches. Machine Learning (ML) and Deep Learning (DL) techniques are used to analyze agricultural data like temperature, soil quality, yield prediction, selling price forecasts, etc. and avoid crop damage from a variety of sources, including diseases. In the proposed work, with particular reference to eight specific sugarcane crop diseases and including healthy crop database, the neural network algorithms are tested and verified in terms quality metrics like accuracy, F1 score, recall and precision.
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Authors and Affiliations

K J Kavitha
1
K Krishna Prasad
2

  1. GM Institute of Technology, VTU
  2. Srinivas University, Mangalore
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Abstract

Foam fractionation process for concentration of laccases from two Basidiomycete strains under different process conditions was investigated. Culture supernatants of Cerrena unicolor and Pleurotus sapidus containing active laccase were used with and without surfactant additives. Two surfactants: cationic cetrimonium bromide (CTAB) and non-ionic Polysorbate 80 were applied in the range from 0.2 mM to 1.5 mM. The pH levels ranging from 3 to 10 were examined with particular attention to pH=4, which is close to the pI of the enzymes. Results show that the source of the enzyme is significant in terms of partitioning efficiency in a foam fractionation process. Laccase from Cerrena unicolor showed the best activity partitioning coefficients between foamate and retentate of almost 200 with yields reaching 50% for pH 7.5 and concentration of CTAB cCTAB = 0.5 mM, whereas laccase from Pleurotus sapidus showed partitioning coefficients of up to 8 with 25% yield for pH 4 and cCTAB = 0.5 mM.

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Authors and Affiliations

Michał Blatkiewicz
Stanisław Ledakowicz
Anna Antecka
Andrzej Górak
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Abstract

In the paper selected methods of measuring the thermal resistance of an IGBT (Insulated Gate Bipolar Transistor) are presented and the accuracy of these methods is analysed. The analysis of the measurement error is performed and operating conditions of the considered device, at which each measurement method assures the least measuring error, are pointed out. Theoretical considerations are illustrated with some results of measurements and calculations.
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Authors and Affiliations

Krzysztof Górecki
Paweł Górecki

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