Abstract
Multilevel inverters have been widely used in various occasions due to their advantages such as lowharmonic content of the outputwaveform. However, because multilevel inverters use a large number of devices, the possibility of circuit failure is also higher than that of traditional inverters. A T-type three-level inverter is taken as the research object, and a diagnostic study is performed on the open-circuit fault of insulated gate bipolar transistor (IGBT) devices in the inverter. Firstly, the change of the current path in the inverter when an open-circuit fault of the device occurred, and the effect on the circuit switching states and the bridge voltages were analyzed. Then comprehensively considered the bridge voltages, and proposed a fault diagnosis method for a T-type three-level inverter based on specific fault diagnosis signals. Finally, the simulation verification was performed. The simulation results prove that the proposed method can accurately locate the open-circuit fault of the inverter device, and has the advantage of being easy to implement.
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