In the article we described the evolution of optical technology from lens-type microscopes working in far-field to SNOM (Scanning

Near-Field Optical Microscopy) constructions. We considered two systems elaborated in our laboratory, namely PSTM system (Photon Scanning Tunelling Microscope) and SNOM system. In both systems we obtained subwavelength resolution. Some details about optical point probe technology in both systems are given and experimental results presented.