The paper deals with fault diagnosis of nonlinear analogue integrated circuits. Soft spot short defects are analysed taking into account variations of the circuit parameters due to physical imperfections as well as self-heating of the chip. A method enabling to detect, locate and estimate the value of a spot defect has been developed. For this purpose an appropriate objective function was minimized using an optimization procedure based on the Fibonacci method. The proposed approach exploits DC measurements in the test phase, performed at a limited number of accessible points. For illustration three numerical examples are given.

The aim of this paper is to derive an analytical equations for the temperature dependent optimum winding size of inductors conducting high frequency ac sinusoidal currents. Derived analytical equations are useful designing tool for research and development engineers because windings made of foil, square-wire, and solid-round-wire windings are considered. Temperature dependent Dowell’s equation for the ac-to-dc winding resistance ratio is given and approximated. Thermally dependent analytical equations for the optimum foil thickness, as well as valley thickness and diameter of the square-wire and solid-round-wire windings are derived from approximated thermally dependent ac-to-dc winding resistance ratios. Minimum winding ac resistance of the foil winding and local minimum of the winding ac resistance of the solid-round-wire winding are verified with Maxwell 3D Finite Element Method simulations.