Title

On the Bias of Terminal Based Gain and Offset Estimation Using the ADC Histogram Test Method

Journal title

Metrology and Measurement Systems

Yearbook

2011

Issue

No 1

Authors

Alegria, F. ; Tiglao, Nestor

Keywords

analog to digital converter ; histogram test method ; estimator bias ; terminal based ; gain ; offset

Divisions of PAS

Nauki Techniczne

Coverage

3-12

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2011

Type

Artykuły / Articles

Identifier

DOI: 10.2478/v10178-011-0001-8 ; ISSN 2080-9050, e-ISSN 2300-1941

Source

Metrology and Measurement Systems; 2011; No 1; 3-12

References

IEEE. IEEE Standard for Digitizing Waveform Recorders-IEEE Std 1057-2007 (April 2008). <i>Institute of Electrical and Electronics Engineers. Inc.</i> ; Carbone P. (2000), Design of ADC sinewave histogram test, Computer Standards & Interfaces, 22, 239, doi.org/10.1016/S0920-5489(00)00044-1 ; Blair J. (1994), Histogram Measurement of ADC Non-linearities Using Sine Waves, IEEE Transactions on Instrumentation and Measurement, 43, 3, 373, doi.org/10.1109/19.293454 ; Chiorboli G. (2000), About the number of records to be acquired for histogram testing of ArD converters using synchronous sinewave and clock generators, Computer Standard & Interfaces, 22, 253, doi.org/10.1016/S0920-5489(00)00043-X ; F. Corrěa Alegria (2004), Error in the Estimation of Transition Voltages with the Standard Histogram Test of ADCs, Measurement. Elsevier Science, 35, 4, 389. ; Löhning M. (2007), The effects of aperture jitter and clock jitter in wideband ADCs, Computer Standards & Interfaces, 29, 11, doi.org/10.1016/j.csi.2005.12.005 ; Arpaia P. (2003), Characterization of digitizer timebase jitter by means of the Allan variance, Computer Standards & Interfaces, 25, 15, doi.org/10.1016/S0920-5489(02)00074-0 ; F. Corrěa Alegria (2006), The Histogram Test of ADCs is Unbiased by Phase Noise, null, 1639. ; F. Corrěa Alegria (2001), Influence of Frequency Errors in the Variance of the Cumulative Histogram, IEEE Transactions on Instrumentation and Measurements, 50, 2, 461, doi.org/10.1109/19.918166 ; F. Corrěa Alegria (2003), Variance of the Cumulative Histogram of ADCs due to Frequency Errors, IEEE Transactions on Instrumentation and Measurements, 52, 1, 69, doi.org/10.1109/TIM.2003.809083 ; Attivissimo F. (2007), Worst-case uncertainty measurement in ADC-based instruments, Computer Standards & Interfaces, 29, 5, doi.org/10.1016/j.csi.2005.12.002 ; Giaquinto N. (1998), Metrological qualification of data acquisition systems, Computer Standards & Interfaces, 19, 219, doi.org/10.1016/S0920-5489(98)00019-1 ; F. Corrěa Alegria (2009), Bias In ADC Terminal Based Gain and Offset Estimation Using the Histogram Method, null, 710. ; F. Corrěa Alegria (2006), ADC Transfer Function Types - A Review, Computer Standards & Interfaces. Elsevier, 28, 5, 553, doi.org/10.1016/j.csi.2005.07.003 ; F. Corrěa Alegria (2007), Standard Histogram Test Precision of ADC Gain and Offset Error Estimation, IEEE Transactions on Instrumentation and Measurement, 56, 5, 1527, doi.org/10.1109/TIM.2007.907978 ; Papoulis A. (1991), Probability, Random Variables and Stochastic Processes. ; "Agilent 33210A 10 MHz Function/Arbitrary Waveform Generator Data Sheet". (2008).