Title

Diagnosis of Incipient Faults in Nonlinear Analog Circuits

Journal title

Metrology and Measurement Systems

Yearbook

2012

Issue

No 2

Authors

Yong Deng ; Yibing Shi ; Wei Zhang

Keywords

nonlinear circuits ; fault diagnosis ; Volterra series ; fractional correlation ; hidden Markov model (HMM)

Divisions of PAS

Nauki Techniczne

Coverage

203-218

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2012

Type

Artykuły / Articles

Identifier

DOI: 10.2478/v10178-012-0018-7 ; ISSN 2080-9050, e-ISSN 2300-1941

Source

Metrology and Measurement Systems; 2012; No 2; 203-218

References

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