Details Details PDF BIBTEX RIS Title Laser Reflectance Interferometry System with a 405 Nm Laser Diode for in Situ Measurements of CVD Diamond Thickness Journal title Metrology and Measurement Systems Yearbook 2013 Issue No 4 Authors Kraszewski, Maciej ; Bogdanowicz, Robert Keywords interferometry ; thin films ; CVD ; diamond ; in situ measurements Divisions of PAS Nauki Techniczne Coverage 543-554 Publisher Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation Date 2013 Type Artykuły / Articles Identifier DOI: 10.2478/mms-2013-0046 ; ISSN 2080-9050, e-ISSN 2300-1941 Source Metrology and Measurement Systems; 2013; No 4; 543-554 <div class="test"></div>