Title

Noise Measurements Of Resistors With The Use Of Dual-Phase Virtual Lock-In Technique

Journal title

Metrology and Measurement Systems

Yearbook

2015

Volume

vol. 22

Issue

No 4

Authors

Stadler, Adam Witold ; Kolek, Andrzej ; Zawiślak, Zbigniew ; Dziedzic, Andrzej

Keywords

1/f noise ; polymer thick-film resistor ; low-frequency noise measurements ; virtual lock-in

Divisions of PAS

Nauki Techniczne

Coverage

503-512

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2015[2015.01.01 AD - 2015.12.31 AD]

Type

Artykuły / Articles

Identifier

DOI: 10.1515/mms-2015-0051 ; ISSN 2080-9050, e-ISSN 2300-1941

Source

Metrology and Measurement Systems; 2015; vol. 22; No 4; 503-512