Title

X-Ray Topography of the Subsurface Crystal Layers in the Skew Asymmetric Reflection Geometry

Journal title

Archives of Metallurgy and Materials

Yearbook

2016

Issue

No 4 December

Authors

Swiątek, Z. ; Fodchuk, I.

Divisions of PAS

Nauki Techniczne

Publisher

Institute of Metallurgy and Materials Science of Polish Academy of Sciences ; Committee of Materials Engineering and Metallurgy of Polish Academy of Sciences

Date

2016

Identifier

DOI: 10.1515/amm-2016-0310 ; e-ISSN 2300-1909

Source

Archives of Metallurgy and Materials; 2016; No 4 December

References

Hartwig (1978), Tech Phys, 26, 535. ; Litvinchuk (2004), Tekn, 27, 71. ; Zaplitnyy (2007), Stat, 204. ; Rustichelli (1975), Mag, 31, 1. ; Kchevetskiy (1990), Phys, 30, 344. ; Vlasov (2007), Metall Mater, 52, 445. ; Kuznizkii (2000), Mater, 36, 615. ; Fodchuk (1995), Mater, 31, 1669. ; Brummer (1976), Stat, 37, 529. ; Fodchuk (1995), Diffraction Optics of the Submicron Surface, Layers Proc SPIE, 2647. ; Bonarski (2000), Electron Rev, 8, 323. ; Vlasov (2008), Thin Solid, Films, 516. ; Brummer (1976), Stat, 33, 587.