Title

A Method of RTS Noise Identification in Noise Signals of Semiconductor Devices in the Time Domain

Journal title

Metrology and Measurement Systems

Yearbook

2010

Issue

No 1

Authors

Stawarz-Graczyk, Barbara ; Dokupil, Dariusz ; Flisikowski, Paweł

Keywords

RTS noise ; Gram-Charlier series ; semiconductor devices ; optocouplers

Divisions of PAS

Nauki Techniczne

Publisher

Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation

Date

2010

Type

Artykuły / Articles

Identifier

DOI: 10.2478/v10178-010-0010-z ; ISSN 2080-9050, e-ISSN 2300-1941

Source

Metrology and Measurement Systems; 2010; No 1

Pages

95-107

References

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