Details Details PDF BIBTEX RIS Title Leakage Current Degradation Due to Ion Drift and Diffusion in Tantalum and Niobium Oxide Capacitors Journal title Metrology and Measurement Systems Yearbook 2017 Volume vol. 24 Issue No 2 Authors Kuparowitz, Martin ; Grmela, Lubomír ; Sedlakova, Vlasta Keywords niobium oxide capacitors ; tantalum capacitors ; leakage current ; ion diffusion ; ion drift Divisions of PAS Nauki Techniczne Coverage 255–264 Publisher Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation Date 2017.06.30 Type Artykuły / Articles Identifier DOI: 10.1515/mms-2017-0034 ; ISSN 2080-9050, e-ISSN 2300-1941 Source Metrology and Measurement Systems; 2017; vol. 24; No 2; 255–264 References Elhadidy (2015), Ion electromigration in CdTe Schottky metal - semiconductor - metal structure, Solid State Ionics, 278. ; Laleko (1982), Ionic current and kinetics of activation of the conductivity of anodic oxide films on tantalum in strong electric fields, Soviet Electrochemistry, 18, 743. ; Teverovsky (2010), Degradation of leakage currents in solid tantalum capacitors under steady - state bias conditions Electronic Components and Technology th, Conference Proc, 752. ; Smulko (2011), Acoustic emission for detecting deterioration of capacitors under aging, Microelectronics Reliability, 51, 621. ; Szewczyk (2016), Voltage Dependence of Supercapacitor Capacitance, Metrol Meas Syst, 23, 403. ; Pavelka (2002), Noise and transport characterisation of tantalum capacitors, Microelectronics Reliability, 42, 841. ; Smulko (2012), Quality testing methods of foil - based capacitors, Microelectronics Reliability, 52, 603. ; Chaneliere (1998), Tantalum pentoxide thin films for advanced dielectric applications Material and, Science Eng, 269. ; Sedlakova (2016), Supercapacitor Degradation Assesment by Power Cycling and Calendar Life Tests, Metrol Meas Syst, 23, 345.