Details Details PDF BIBTEX RIS Title Semiconductor contact layer characterization in a context of hall effect measurements Journal title Metrology and Measurement Systems Yearbook 2019 Volume vol. 26 Issue No 1 Authors Kowalewski, Andrzej ; Wróbel, Jarosław ; Boguski, Jacek ; Gorczyca, Kinga ; Martyniuk, Piotr Keywords metal contact ; contact layer ; contact resistance ; Hall effect ; resistivity ; van der Pauw method ; MSM structure ; semiconductors’ characterization Divisions of PAS Nauki Techniczne Coverage 109-114 Publisher Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation Date 2019.04.01 Type Artykuły / Articles Identifier DOI: 10.24425/mms.2019.126324 ; e-ISSN 2300-1941 Source Metrology and Measurement Systems; 2019; vol. 26; No 1; 109-114 <div class="test"></div>