Details Details PDF BIBTEX RIS Title ARMScope – the versatile platform for scanning probe microscopy systems Journal title Metrology and Measurement Systems Yearbook 2020 Volume vol. 27 Issue No 1 Authors Świadkowski, Bartosz ; Piasecki, Tomasz ; Rudek, Maciej ; Świątkowski, Michał ; Gajewski, Krzysztof ; Majstrzyk, Wojciech ; Babij, Michał ; Dzierka, Andrzej ; Gotszalk, Teodor Keywords Scanning probe microscopy ; AFM ; Kelvin Probe force microscopy ; scanning tunnelling microscopy Divisions of PAS Nauki Techniczne Coverage 119-130 Publisher Polish Academy of Sciences Committee on Metrology and Scientific Instrumentation Date 2020.03.18 Type Article Identifier DOI: 10.24425/mms.2020.131711 Source Metrology and Measurement Systems; 2020; vol. 27; No 1; 119-130 <div class="test"></div>