Title

THz detectors based on Si-CMOS technology field effect transistors – advantages, limitations and perspectives for THz imaging and spectroscopy

Journal title

Opto-Electronics Review

Yearbook

2018

Volume

vol. 26

Issue

No 4

Authors

Marczewski, J. ; Coquillat, D. ; Knap, W. ; Kolacinski, C. ; Kopyt, P. ; Kucharski, K. ; Lusakowski, J. ; Obrebski, D. ; Tomaszewski, D. ; Yavorskiy, D. ; Zagrajek, P. ; Ryniec, R. ; Palka, N.

Keywords

Submillimeter wave detectors ; THz detectors ; THz imaging ; THZ spectroscopy ; CMOS technology

Divisions of PAS

Nauki Techniczne

Coverage

261-269

Publisher

Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of Technology

Date

13.09.2018

Type

Article

Identifier

ISSN 1896-3757

Source

Opto-Electronics Review; 2018; vol. 26; No 4; 261-269

Abstracting & Indexing

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ProQuest relevant databases
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