Details Details PDF BIBTEX RIS Title Ion etching of HgCdTe: Properties, patterns and use as a method for defect studies Journal title Opto-Electronics Review Yearbook 2017 Volume vol. 25 Issue No 2 Authors Izhnin, I.I. ; Mynbaev, K.D. ; Voitsekhovskii, A.V. ; Korotaev, A.G. ; Fitsych, O.I. ; Pociask-Bialy, M. Keywords HgCdTe ; Ion etching ; Photodetectors ; Defects ; Doping Divisions of PAS Nauki Techniczne Coverage 148-170 Publisher Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of Technology Date 29.04.2017 Type Article Identifier ISSN 1896-3757 Source Opto-Electronics Review; 2017; vol. 25; No 2; 148-170 <div class="test"></div>