Details

Title

A method for Soft Fault Diagnosis of Linear Analog Circuits Using the Laplace Transform Technique

Journal title

International Journal of Electronics and Telecommunications

Yearbook

2021

Volume

vol. 67

Issue

No 3

Authors

Affiliation

Tadeusiewicz, Michał : Lodz University of Technology, Department of Electrical, Electronic, Computer and Control Engineering, Lodz, Poland ; Ossowski, Marek : Lodz University of Technology, Department of Electrical, Electronic, Computer and Control Engineering, Lodz, Poland ; Korzybski, Marek : Lodz University of Technology, Department of Electrical, Electronic, Computer and Control Engineering, Lodz, Poland

Keywords

analog linear circuits ; fault diagnosis ; multiple softfaults ; the Laplace transform

Divisions of PAS

Nauki Techniczne

Coverage

531-536

Publisher

Polish Academy of Sciences Committee of Electronics and Telecommunications

Bibliography

[1] D. Gizopoulos, Advances in electronic testing. Challenges and methodologies. (Springer, Dordrecht, 2006)
[2] P. Kabisatpathy, A. Barua and S. Sinha, Fault diagnosis of analog integrated circuits. (Springer, Dordrecht, 2005).
[3] Y. Sun (ed.), Test and diagnosis of analog mixed-signal and RF integrated circuits: the system on chip approach, (IET Digital Library, UK, 2008)
[4] D. Binu, B.S. Kariyappa, “A survey on fault diagnosis of analog circuits: Taxonomy and state of the art”, Int. J. Electron. Commun. (AEÜ), vol. 73, pp. 68-83, 2017. doi: 10.1016/j.aeue.2017.01.002.
[5] Z. Czaja, “Using a square-wave signal for fault diagnosis of analog parts of mixed-signal electronic embedded systems”, IEEE Trans. Instrum. Meas., vol. 57, pp. 1589-1595, 2008. doi: 10.1109/TIM.2008.925342
[6] H. Han, H. Wang, S. Tian, N. Zhang, “A new analog circuit fault diagnosis method based on improved Mahalanobis distance”, J. Electron. Test., vol. 29, pp. 95–102, 2013. https://doi.org/10.1007/s10836-012- 5342-z.
[7] Ch. Yang, S. Tian, B. Long, F. Chen, “Methods of handling the tolerance and test-point selection problem for analog-circuit fault diagnosis”, IEEE Trans. Instrum. Means., vol. 60, pp. 176-185, 2011. doi: 10.1109/TIM.2010.2050356
[8] Q.Z. Zhou, Y.L. Xie, X.F. Li, D.J. Bi, X. Xie, S.S. Xie, “Methodology and equipments for analog circuit parametric faults diagnosis based on matrix eigenvalues”, IEEE Trans. Appl. Superconductivity, vol. 24, pp. 1–6, 2014. https://doi.org/10.1109/TASC.2014.2340447.
[9] Y. Deng, Y. N. Liu, “Soft fault diagnosis in analog circuits based on bispectral models”, J. Electron. Test., vol. 33, pp. 543-557, 2017. https://doi.org/10.1007/s10836-017-5686-5.
[10] S. Djordjevic, M.T. Pesic, “A fault verification method based on the substitution theorem and voltage-current phase relationship”, J. Electron. Test., vol. 36, pp. 617-629, 2020. https://doi.org/10.1007/s10836-020- 05901-5.
[11] T. Gao, J. Yang, S. Jiang, “A novel incipient fault diagnosis method for analog circuits based on GMKL-SVM and wavelet fusion feature”. IEEE Trans. Instrum. Meas., vol. 70, 2021. https://doi.org/10.1109/TIM.2020.3024337.
[12] Y. Li, R. Zhang, Y. Guo, P. Huan, M. Zhang, “Nonlinear soft fault diagnosis of analog circuits based on RCCA-SVM”, IEEE Access., vol. 8, pp. 60951-60963, 2020. doi.org/10.1109/ACCESS.2020.2982246.
[13] M. Tadeusiewicz, S. Hałgas, “A new approach to multiple soft fault diagnosis of analog BJT and CMOS circuits”, IEEE Trans. Instrum. Meas., vol. 64, pp. 2688–2695, 2015. https://doi.org/10.1109/TIM.2015.2421712.
[14] M. Tadeusiewicz, S. Hałgas, “A method for local parametric fault diagnosis of a broad class of analog integrated circuits”, IEEE Trans. Instrum. Meas., vol. 67, pp. 328–337, 2018. https://doi.org/10.1109/TIM.2017.2775438.
[15] Y. Xie, X. Li, S. Xie, X. Xie, Q. Zhou, “Soft fault diagnosis of analog circuits via frequency response function measurements”, J. Electron. Test., vol. 30, pp. 243–249, 2014. https://doi.org/10.1007/s10836-014- 5445-9.
[16] M. Tadeusiewicz, S. Hałgas, M. Korzybski, “An algorithm for soft-fault diagnosis of linear and nonlinear circuits”, IEEE Trans. Circ. Syst.-I., vol. 49, pp. 1648-1653, 2002. doi: 10.1109/TCSI.2002.804596.
[17] M. Tadeusiewicz, S. Hałgas, “Soft fault diagnosis of linear circuits with the special attention paid to the circuits containing current conveyors”, Int. J. Electron Commun. (AEÜ), vol. 115, 2020. https://doi.org/10.1016/j.aeue.2019.153036.
[18] M. Tadeusiewicz and S. Hałgas, “A method for multiple soft fault diagnosis of linear analog circuits”, Measurement, vol. 131, pp. 714-722, 2019. doi: 10.1016/j.measurement.2018.09.001.
[19] M. Jahangiri, F. Razaghian, “Fault detection in analogue circuit using hybrid evolutionary algorithm and neural network”, Analog Int. Cir. Sig. Proc., vol. 80, pp. 551-556, 2014. https://doi.org/10.1007/s10470-014- 0352-7
[20] P. Jantos, D. Grzechca, J. Rutkowski, “Evolutionary algorithms for global parametric fault diagnosis in analogue integrated circuits”, Bull. Polish Acad. Scien., vol. 60, pp. 133-142, 2012. doi: 10.2478/v10175- 012-0019-4
[21] C. Yang, “Multiple soft fault diagnosis of analog filter circuit based on genetic algorithm”, IEEE Access., vol. 8, pp. 8193-8201, 2020. https://doi.org/10.1109/ACCESS.2020.2964054.
[22] D. Grzechca, “Soft fault clustering in analog electronic circuits with the use of self organizing neural network”, Metrol Meas Syst., vol. 8, pp. 555–568, 2011. doi: 10.2478/v10178-011-0054-8
[23] B. Long, M. Li, H. Wang, S. Tian, “Diagnostics of analog circuits based on LS-SVM using time-domain features”, Circuits Syst. Signal. Process., vol. 32, pp. 2683-2706, 2013. https://doi.org/10.1007/s00034-013-9614-3
[24] R. Sałat, S, Osowski, “Support Vector Machine for soft fault location in electrical circuits”, J. Intelligent Fuzzy Systems., vol. 22, pp. 21-31, 2011. doi: 10.3233/IFS-2010-0471.
[25] D. Grzechca, “Construction of an expert system based on fuzzy logic for diagnosis of analog electronic circuits”, Int. Journal of Electronic and Telecomunications, vol. 61, pp. 77-82, 2015. doi: 10.1515/eletel-2015- 0010
[26] P. Bilski, “Analysis of the ensemble of regression algorithms for the analog circuit parametric identification”, Measurement, vol. 170, pp. 503–514, 2020. https://doi.org/10.1016/j.measurement.2020.107829.
[27] M. Tadeusiewicz, M. Ossowski, “A verification technique for multiple soft fault diagnosis of linear analog circuits”, Int. Journal of Electronic and Telecomunications, vol. 64, pp. 83-89, 2018. doi: 10.24425/118150.
[28] M. Tadeusiewicz, M. Ossowski, “Modeling analysis and diagnosis of analog circuits in z-domain”, J. Circ. Syst. Comput, vol. 29, no. 02, 2020. https://doi.org/10.1142/S0218126620500280
[29] G. Fedi, S. Manetti, M.C. Piccirilli, J. Starzyk, “Determination of an optimum set of testable components in the fault diagnosis of analog linear circuits”, IEEE Trans. Circ. Syst.-I, vol. 46, pp. 779-787, 1999. doi: 10.1109/81.774222
[30] S. Manetti, M.C. Piccirilli, “A singular-value decomposition approach for ambiguity group determination in analog circuits”, IEEE Trans. Circ. Syst.-I, vol. 50 pp. 477-487, 2003. doi: 10.1109/TCSI.2003.809811.
[31] S. Saeedi, S.H. Pishgar, M. Eslami, “Optimum test point selection method for analog fault dictionary techniques”, Analog Integr. Circuits Signal Processing., vol. 100, pp. 167-179, 2019. https://doi.org/10.1007/s10470-019-01453-7.
[32] X. Tang, A. Xu, R. Li, M. Zhu, J. Dai, “Simulation-based diagnostic model for automatic testability analysis of analog circuit”, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems., vol. 37, pp. 1483-1493, 2018. https://doi.org/10.1109/TCAD.2017.2762647.

Date

2021.09.23

Type

Article

Identifier

DOI: 10.24425/ijet.2021.137843
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