Szczegóły

Tytuł artykułu

Application of cross-correlation-based transimpedance amplifier in InAs and InAsSb IR detectors noise measurements

Tytuł czasopisma

Opto-Electronics Review

Rocznik

2022

Wolumin

30

Numer

2

Autorzy

Afiliacje

Achtenberg , Krzysztof : Institute of Optoelectronics, Military University of Technology, 2 Kaliskiego St., 00-908 Warsaw, Poland ; Mikołajczyk, Janusz : Institute of Optoelectronics, Military University of Technology, 2 Kaliskiego St., 00-908 Warsaw, Poland ; Bielecki, Zbigniew : Institute of Optoelectronics, Military University of Technology, 2 Kaliskiego St., 00-908 Warsaw, Poland

Słowa kluczowe

cross-correlation ; IR detectors ; noise ; transimpedance amplifier ; InAs ; InAsSb

Wydział PAN

Nauki Techniczne

Zakres

e141126

Wydawca

Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of Technology

Bibliografia

  1. Vandamme, L. J. Noise as a diagnostic tool for quality and reliability of electronic devices. IEEE Trans. Electron. Devices. 41, 2176–2187 (1994). https://doi.org/10.1109/16.333839
  2. Kotarski, M. & Smulko, J. M. Noise measurement set-ups for fluctuations-enhanced gas sensing. Metrol. Meas. Syst. 16, 457–464 (2009). http://www.metrology.pg.gda.pl/full/2009/M&MS_2009_457.pdf
  3. Jones, B. Electrical noise as a reliability indicator in electronic devices and components. IEE Proc. G 149, 13–22 (2002). https://doi.org/10.1049/ip-cds:20020331
  4. Dyakonova, N., Karandashev, S. , Levinshtein, M .E., Matveev, B. A. & Remennyi, M. A. Low frequency noise in p-InAsSbP / n-InAs infrared photodiodes. Semicond. Sci. Technol. 33, 065016 (2018). https://doi.org/10.1088/1361-6641/aac15d
  5. Ciura, L., Kolek, A., Michalczewski, K., Hackiewicz, K. & Martyniuk, P. 1/f noise in InAs/InAsSb superlattice photoconductors. IEEE Trans. Electron Devices. 67, 3205–3210 (2020). https://doi.org/10.1109/TED.2020.2998449
  6. Savich, G. , Pedrazzani, J. R., Sidor, D. E., Maimon, S. & Wicks, G. W. Dark current filtering in unipolar barrier infrared detectors. Appl. Phys. Lett. 99, 121112 (2011). https://doi.org/10.1063/1.3643515
  7. Cervera, C. et al. Dark current and noise measurements of an InAs/GaSb superlattice photodiode operating in the midwave infrared domain. Electron. Mater. 41, 2714–2718 (2012). https://doi.org/10.1007/s11664-012-2035-4
  8. Ciofi, C., Giusi, G., Scandurra, G. & Neri, B. Dedicated instrumentation for high sensitivity, low frequency noise measurement systems. Noise Lett. 4, L385–L402 (2004). https://doi.org/10.1142/S0219477504001963
  9. Horowitz, P. & Hill, W. The Art of Electronics (Cambridge University Press, 2015).
  10. Achtenberg, K. et al. Low-frequency noise measurements of IR photodetectors with voltage cross correlation system. Measurement 183, 109867 (2021). https://doi.org/10.1016/j.measurement.2021.109867
  11. Ciura, Ł., Kolek, A., Gawron, W., Kowalewski, A. & Stanaszek, D. Measurements of low frequency noise of infrared photodetectors with transimpedance detection system. Meas. Syst. 21,
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  12. Giusi, G., Pace, C. & Crupi, F. Cross-correlation-based trans-impedance amplifier for current noise measurements. J. Circ. Theor. Appl. 37, 781–792 (2008). https://doi.org/10.1002/cta.517
  13. Jaworowicz, K., Ribet-Mohamed, I., Cervera, C., Rodriguez, J. & Christol, P. Noise characterization of midwave infrared InAs/GaSb superlattice pin photodiode. IEEE Photon. Technol. 23, 242–244 (2011). https://doi.org/10.1109/lpt.2010.2093877
  14. Taalat, R., Christol, P. & Rodriguez, J. Dark current and noise measurements of an InAs/GaSb superlattice photodiode operating in the midwave infrared domain. Electron. Mater. 41, 2714–2718 (2012). https://doi.org/10.1007/s11664-012-2035-4
  15. Ramos, D. et al. 1/f noise and dark current correlation in midwave InAs/GaSb Type-II superlattice IR detectors. Status Solidi A. 218, 2000557 (2020). https://doi.org/10.1002/pssa.202000557
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Data

26.04.2022

Typ

Article

Identyfikator

DOI: 10.24425/opelre.2022.141126 ; ISSN 1896-3757

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