Details
Title
Sensor performance and cut-off wavelength tradeoffs of III-V focal plane arraysJournal title
Opto-Electronics ReviewYearbook
2023Volume
31Issue
special issueAuthors
Affiliation
James, Jonathan Ch. : Electro-Optical Systems Laboratory, Georgia Tech Research Institute, 925 Dalney St. NW, Atlanta, GA 30332, USA ; Haran, Terence L. : Electro-Optical Systems Laboratory, Georgia Tech Research Institute, 925 Dalney St. NW, Atlanta, GA 30332, USA ; Lane, Sarah E. : Electro-Optical Systems Laboratory, Georgia Tech Research Institute, 925 Dalney St. NW, Atlanta, GA 30332, USAKeywords
infrared focal plane arrays ; III-V semiconductor infrared detector technologies ; infrared sensor performance modelling ; infrared sensor design ; mid-wave and long-wave infrared sensorsDivisions of PAS
Nauki TechniczneCoverage
e144570Publisher
Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of TechnologyDate
24.02.2023Type
ArticleIdentifier
DOI: 10.24425/opelre.2023.144570Abstracting & Indexing
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