Szczegóły Szczegóły PDF BIBTEX RIS Tytuł artykułu A probabilistic approach for approximation of optical and opto-electronic properties of an opto-semiconductor wafer under consideration of measuring inaccuracy and model uncertainty Tytuł czasopisma Opto-Electronics Review Rocznik 2023 Wolumin 31 Numer 2 Afiliacje Stroka, Stefan M. : Department of Statistics, Faculty of Mathematics, Informatics and Statistics, LMU Munich, 80539 Munich, Germany ; Stroka, Stefan M. : ams-OSRAM International GmbH, 93055 Regensburg, Germany ; Heumann, Christian : Department of Statistics, Faculty of Mathematics, Informatics and Statistics, LMU Munich, 80539 Munich, Germany ; Suhrke, Fabian : ams-OSRAM International GmbH, 93055 Regensburg, Germany ; Meindl, Kathrin : ams-OSRAM International GmbH, 93055 Regensburg, Germany Autorzy Stroka, Stefan M. ; Heumann, Christian ; Suhrke, Fabian ; Meindl, Kathrin Słowa kluczowe Gaussian process regression ; machine learning ; uncertainty quantification ; photoluminescence ; opto-semiconductor wafer measuring Wydział PAN Nauki Techniczne Zakres e145863 Wydawca Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of Technology Data 12.05.2023 Typ Article Identyfikator DOI: 10.24425/opelre.2023.145863 ; ISSN 1896-3757