Details
Title
Self-noise reduction in a FOG-based rotational seismometer confirmed by Allan variance analysisJournal title
Opto-Electronics ReviewYearbook
2024Volume
32Issue
4Authors
Affiliation
Zając, Piotr : Department of Microelectronics and Computer Science, Lodz University of Technology, ul. Wolczanska 221, 93-005 Lodz, Poland ; Amrozik, Piotr : Department of Microelectronics and Computer Science, Lodz University of Technology, ul. Wolczanska 221, 93-005 Lodz, Poland ; Kiełbik, Rafał : Department of Microelectronics and Computer Science, Lodz University of Technology, ul. Wolczanska 221, 93-005 Lodz, Poland ; Maj, Cezary : Department of Microelectronics and Computer Science, Lodz University of Technology, ul. Wolczanska 221, 93-005 Lodz, Poland ; Szermer, Michał : Department of Microelectronics and Computer Science, Lodz University of Technology, ul. Wolczanska 221, 93-005 Lodz, Poland ; Starzak, Łukasz : Department of Microelectronics and Computer Science, Lodz University of Technology, ul. Wolczanska 221, 93-005 Lodz, Poland ; Pękosławski, Bartosz : Department of Microelectronics and Computer Science, Lodz University of Technology, ul. Wolczanska 221, 93-005 Lodz, Poland ; Jabłoński, Grzegorz : Department of Microelectronics and Computer Science, Lodz University of Technology, ul. Wolczanska 221, 93-005 Lodz, Poland ; Tylman, Wojciech : Department of Microelectronics and Computer Science, Lodz University of Technology, ul. Wolczanska 221, 93-005 Lodz, Poland ; Kurzych, Anna T. : Institute of Applied Physics, Military University of Technology, ul. gen. Sylwestra Kaliskiego 2, 00-908 Warsaw, Poland ; Kurzych, Anna T. : Elproma Elektronika Sp. z o.o., ul. Dunska 2A, 05-152 Czosnow, Poland ; Jaroszewicz, Leszek R. : Institute of Applied Physics, Military University of Technology, ul. gen. Sylwestra Kaliskiego 2, 00-908 Warsaw, Poland ; Jaroszewicz, Leszek R. : Elproma Elektronika Sp. z o.o., ul. Dunska 2A, 05-152 Czosnow, PolandKeywords
fibre-optic rotational seismometer ; fibre-optic gyroscope ; Allan variance ; noise ; angle random walk ; bias instabilityDivisions of PAS
Nauki TechniczneCoverage
e152766Publisher
Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of TechnologyDate
30.11.2024Type
ArticleIdentifier
DOI: 10.24425/opelre.2024.152766Abstracting & Indexing
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