Details Details PDF BIBTEX RIS Title Heat dissipation and temperature distribution in long interconnect lines Journal title Bulletin of the Polish Academy of Sciences Technical Sciences Yearbook 2010 Volume 58 Issue No 1 Authors Gnidzinska, K. ; De Mey, G. ; Napieralski, A. Divisions of PAS Nauki Techniczne Coverage 119-124 Date 2010 Identifier DOI: 10.2478/v10175-010-0012-8 ; ISSN 2300-1917 Source Bulletin of the Polish Academy of Sciences: Technical Sciences; 2010; 58; No 1; 119-124 References <i>International Technology Roadmap for Semiconductors</i> <a target="_blank" href='http://www.itrs.net/'>http://www.itrs.net/</a> ; Chatzigeorgiou A. (2001), Modeling CMOS gates driving RC interconnect loads, IEEE Trans. Circuits and Systems II: Analog and Digital Signal Processing, 48, 4, 413. ; Ismail Y. (1999), Dynamic and short-circuit power of CMOS gates driving lossless transmission lines, IEEE Trans. Circuits and Systems I: Analog and Digital Signal Processing, 46, 8, 950. ; <i>Predictive Technology Model (PTM)</i> <a target="_blank" href='http://ptm.asu.edu/'>http://ptm.asu.edu/</a> ; Vermeersch B. (2006), Thermal impedance plots of micro-scaled devices, Microelectronics and Reliability, 46, 1, 174. ; G. De Mey (2002), Various Applications of the Boundary Element Method. ; Çengel Y. (2002), Heat Transfer: a Practical Approach. ; Chiang T.-Y. (2002), Analytical thermal model for multilevel VLSI interconnects incorporating via effect, IEEE Electron Device Letters, 23, 1, 31.