Details Details PDF BIBTEX RIS Title Study of Capacitor & Diode Aging effects on Output Ripple in Voltage Regulators and Prognostic Detection of Failure Journal title International Journal of Electronics and Telecommunications Yearbook 2022 Volume vol. 68 Issue No 2 Affiliation Sharma K, Preethi : Department of ECE, SJB Institute of Technology, Bengaluru, India ; Vijayakumar, T. : Department of ECE, SJB Institute of Technology, Bengaluru, India Authors Sharma K, Preethi ; Vijayakumar, T. Keywords buck ; MOSFET ; ESR ; SMPS ; voltage ripple Divisions of PAS Nauki Techniczne Coverage 281-286 Publisher Polish Academy of Sciences Committee of Electronics and Telecommunications Date 2022.06.12 Type Article Identifier DOI: 10.24425/ijet.2022.139879