Details

Title

Why FETs detect a THz signal at a frequency far beyond their amplifying capabilities

Journal title

Opto-Electronics Review

Yearbook

2024

Volume

32

Issue

4

Authors

Affiliation

Marczewski, Jacek : Institute of Microelectronics and Photonics, Lukasiewicz Research Center, al. Lotników 32/46, 02-668 Warsaw, Poland ; Zaborowski, Michał : Institute of Microelectronics and Photonics, Lukasiewicz Research Center, al. Lotników 32/46, 02-668 Warsaw, Poland ; Tomaszewski, Daniel : Institute of Microelectronics and Photonics, Lukasiewicz Research Center, al. Lotników 32/46, 02-668 Warsaw, Poland ; Zagrajek, Przemysław : Institute of Optoelectronics, Military University of Technology, ul. gen. S. Kaliskiego 2, 00-908 Warsaw, Poland ; Pałka, Norbert : Institute of Optoelectronics, Military University of Technology, ul. gen. S. Kaliskiego 2, 00-908 Warsaw, Poland

Keywords

terahertz detection ; field-effect transistors ; Dyakonov-Shur theory ; resistive mixing ; surface plasmons

Divisions of PAS

Nauki Techniczne

Coverage

e151989

Publisher

Polish Academy of Sciences (under the auspices of the Committee on Electronics and Telecommunication) and Association of Polish Electrical Engineers in cooperation with Military University of Technology

Date

02.10.2024

Type

Article

Identifier

DOI: 10.24425/opelre.2024.151989

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