Nauki Techniczne

Opto-Electronics Review

Zawartość

Opto-Electronics Review | 2024 | 32 | 4

Abstrakt

Field-effect transistors (FETs) are efficient detectors of THz radiation. Despite over three decades of research, controversy still exists regarding the detection mechanism. The article attempts to solve this problem systemically. Existing approaches to modeling THz detection are critically reviewed, including plasmonic, resistive mixing, hot carrier and thermal models. Limitations and inconsistencies of the first two approaches, along with some classical physics principles and experiments conducted, were identified. These include the facts that some models were formulated independently of material relaxation time constraints, and the plasmonic approach does not take into account the conditions for the formation of surface plasmon-polarons and does not describe the case of p-type devices (hole plasmons have never been experimentally recorded). Relevant measurements and theoretical considerations illustrate the inadequacy of these models. As a result of this analysis, thermoelectric models are expected to explain THz sensing by FETs.
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Autorzy i Afiliacje

Jacek Marczewski
1
ORCID: ORCID
Michał Zaborowski
1
ORCID: ORCID
Daniel Tomaszewski
1
ORCID: ORCID
Przemysław Zagrajek
2
ORCID: ORCID
Norbert Pałka
2
ORCID: ORCID

  1. Institute of Microelectronics and Photonics, Lukasiewicz Research Center, al. Lotników 32/46, 02-668 Warsaw, Poland
  2. Institute of Optoelectronics, Military University of Technology, ul. gen. S. Kaliskiego 2, 00-908 Warsaw, Poland

Abstrakt

As part of the research and development project, a multi-touch multimedia system was implemented, working exclusively on the basis of optical technologies. The model of device with a diagonal of 42” was developed and made with 4K TV image technology and simultaneous detection in near infrared. The control of individual system modules was carried out on RaspberryPi microcomputers without typical operating system. The functionality of a conventional large-format display with unlimited multi-touch, QR code scanner, and a document scanner has been achieved in one housing. Luminance distribution tests were carried out in accordance with ANSI requirements and infrared radiation for detection work.
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Autorzy i Afiliacje

Maciej Zajkowski
1
ORCID: ORCID
Piotr Kardasz
1
ORCID: ORCID
Łukasz Budzyński
1
ORCID: ORCID
Grzegorz Masłowski
2
ORCID: ORCID

  1. Faculty of Electrical Engineering, Department of Photonics, Electronic and Lighting Technology, Bialystok University of Technology, ul. Wiejska 45, 15-351 Białystok, Poland
  2. Faculty of Electrical and Computer Engineering, Department of Electrical and Computer Engineering Fundamentals, Rzeszow University of Technology, al. Powstańców Warszawy 12, 35-959 Rzeszów, Poland

Abstrakt

The paper describes the structural, optical, tribological, and mechanical properties of as‑prepared and annealed titanium dioxide (TiO2) coatings. TiO2 films were deposited by the electron beam evaporation (EBE) and additionally annealed at a temperature up to 800 °C using a tubular furnace. X-ray diffraction (XRD) analysis identified the amorphous phase of coatings as-prepared and annealed at 200 °C. The phase transition to anatase occurred at 400 °C, while annealing at 600 °C and 800 °C did not induce a phase transition to the rutile phase. The crystallite size increased with an annealing up to 40.4 nm at 800 °C. Raman spectroscopy confirmed the anatase phase in thin films annealed at 400 °C and above. A scanning electron microscope (SEM) images revealed surface morphology and grain structure changes after post-process high-temperature annealing. The optical transmission measurements showed a redshift in the fundamental absorption edge with increasing annealing temperature, accompanied by a decreased transparency level. The value of an optical band gap energy (Egopt) decreased to 2.77 eV for films annealed at 800 °C. Tribological tests revealed reduced scratch resistance with higher annealing temperatures, which was attributed to increased surface roughness and coating removal. Nanoindentation measurements showed a decrease in hardness with annealing temperature, attributed to changes in crystallite size and surface morphology. This comprehensive analysis of TiO2 thin-film coatings showed that the post-process annealing should be carefully controlled for films used in optoelectronic applications.
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Autorzy i Afiliacje

Agata Obstarczyk
1
ORCID: ORCID
Ewa Mańkowska
1
ORCID: ORCID
Wiktoria Weichbrodt
1
ORCID: ORCID
Paulina Kapuścik
1
ORCID: ORCID
Wojciech Kijaszek
1
ORCID: ORCID
Michał Mazur
1
ORCID: ORCID

  1. Faculty of Electronics, Photonics and Microsystems, Wroclaw University of Science & Technology, ul. Janiszewskiego 11/17, 50-372 Wroclaw, Poland

Abstrakt

One of the important directions of research in photovoltaics is the development of new thin-film technology, which can replace the currently used, more expensive bulk silicon technology. The article discusses the findings from research focused on optimizing the parameters for the deposition of silicon thin films with P-type electrical conductivity for applications in photovoltaics. The growth rate was determined depending on the change in substrate temperature using reflectometry and the influence of deposition time on optical properties was determined using UV/VIS spectroscopy. Photovoltaic structures were made on substrates with an ITO layer and their electrical parameters were measured. The authors applied the magnetron sputtering method to deposit the layers, selecting it over the commercially used the chemical vapor deposition (CVD) method. This replacement could alleviate the necessity for high temperatures and broaden the potential applications of thin-film solar cells.
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Autorzy i Afiliacje

Marek Szindler
1
ORCID: ORCID
Magdalena M. Szindler
2
ORCID: ORCID
Krzysztof Lukaszkowicz
2
ORCID: ORCID
Krzysztof Matus
3
ORCID: ORCID
Paweł Nuckowski
3

  1. Scientific and Didactic Laboratory of Nanotechnology and Material Technologies, Faculty of Mechanical Engineering, Silesian University of Technology, ul. Towarowa 7, 44-100 Gliwice, Poland
  2. Department of Engineering Materials and Biomaterials, Silesian University of Technology, ul. Konarskiego 18a, 44-100 Gliwice, Poland
  3. Materials Research Laboratory, Silesian University of Technology, ul. Konarskiego 18a, 44-100 Gliwice, Poland

Abstrakt

The aim of this work was to improve the quality of the GaSb buffer layers on GaAs substrates using the molecular beam epitaxy (MBE) technology. The high quality of the GaSb buffer layers is one of the most important elements enabling the synthesis of good quality of type II superlattices (T2SL) structures for infrared applications. The main challenges in this regard are: compensation of the difference in lattice constants between GaAs and GaSb and obtaining the highest achievable surface quality of the final GaSb layer. In the literature, many authors describe different techniques to obtain the best quality of a GaSb buffer layer. In this work, we present the results of HRXRD, AFM, TOF-SIMS, SEM, and Nomarski optical microscope measurements obtained for 2 μm thick GaSb buffer layers. The GaSb layers are made according to different techniques and these results are compared with a GaSb buffer construction technique according to our own technology. During the processes, we also obtained an unintentional structure of one of the buffer layers, which allowed us to obtain very good results in terms of surface structure and crystallographic quality where FWHM in ωRC scan was equal to 138 arcsec and RMS 0.20 nm proving that there is still a lot of work to be done in this area.
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Autorzy i Afiliacje

Dawid Jarosz
1
ORCID: ORCID
Ewa Bobko
1
ORCID: ORCID
Małgorzata Trzyna-Sowa
1
ORCID: ORCID
Ewa Przeździecka
2
ORCID: ORCID
Marcin Stachowicz
2
ORCID: ORCID
Marta Ruszała
1
ORCID: ORCID
Piotr Krzemiński
1
ORCID: ORCID
Anna Juś
1
ORCID: ORCID
Kinga Maś
1
ORCID: ORCID
Renata Wojnarowska-Nowak
1
ORCID: ORCID
Oskar Nowak
1
Daria Gudyka
1
Brajan Tabor
1
Michał Marchewka
1
ORCID: ORCID

  1. Institute of Materials Engineering, Center for Microelectronics and Nanotechnology, University of Rzeszow, al. Rejtana 16, 35-959 Rzeszow, Poland
  2. Institute of Physics, Polish Academy of Sciences, al. Lotników 32/46, 02-668 Warsaw, Poland

Abstrakt

The direct measurement method of AM-to-PM phenomena in fast silicon and InGaAs photodiodes is described. The setup is simple, relatively inexpensive and allows fast and precise measurements not only in a laboratory environment. During sample tests, the authors have found that the influence of bias voltage on the phase shift of an optical signal conversion is significant. The reported effect together with the influence of modulation depth on phase shift (AM-to-PM conversion) has a negative impact on an optical signal reception especially in coherent applications. The authors show that, with our proposed setups, it is possible to find optimal bias voltage and optimal optical power in order to reduce electrical phase noise of the photodetector.
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Autorzy i Afiliacje

Grzegorz Budzyn
1
ORCID: ORCID
Jędrzej Barański
1 2
ORCID: ORCID

  1. Wroclaw University of Science and Technology, ul. Wybrzeże Wyspiańskiego 27, 50-370 Wrocław, Poland
  2. Lasertex Co. Sp. z o.o., ul. Swojczycka 26, 51-501 Wroclaw, Poland

Abstrakt

In this work, the oxyfluoride glass-ceramic materials containing LaF3 nanocrystals, prepared by using the sol-gel method, were described. The influence of fluoride nanocrystals on the photoluminescence properties of selected lanthanide ions was determined. The experimental results obtained for nano-glass-ceramics were compared to the precursor xerogels. Those Ln3+-doped sol-gel materials with dispersed LaF3 nanocrystals exhibit several visible emission bands. It was observed that heat-treatment process caused the elongation of the lifetimes of the 5D0 state from τ = 0.22 ms to τ1 = 0.79 ms, τ2 = 9.76 ms (for Eu3+-doped materials) and of the 4F9/2 state from τ = 0.027 ms to τ1 = 0.034 ms, τ2 = 1.731 ms (for Dy3+‑doped materials). The performed studies clearly revealed that luminescence behaviour also depends on an activator concentration and a distribution of energy levels of lanthanide ions.
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Autorzy i Afiliacje

Joanna Śmiarowska
1
ORCID: ORCID
Natalia Pawlik
1
ORCID: ORCID
Joanna Pisarska
1
ORCID: ORCID
Wojciech A. Pisarski
1

  1. Institute of Chemistry, University of Silesia, ul. Szkolna 9, 40‐007 Katowice, Poland

Abstrakt

This paper presents the results of a study on the modification of dye-sensitized solar cells (DSSCs) using various phenothiazine derivatives, N719, and a mixture of these. The influence of the solvent used to prepare the dye solution, as well as the use of a TiO2 blocking layer, the addition of a co-adsorbent, or a mixture of dyes with N719 are presented. Characterisation of photoanodes was carried out to determine the UV-Vis absorption properties, morphology, and photovoltaic parameters of the fabricated solar cells. The use of different solvents for the preparation of dye solutions resulted in DSSCs efficiencies in the range of 1.55–7.26%. The most advantageous was using an ACN:t-BuOH mixture, which provided the best efficiency. The application of further modifications in the form of the addition of chenodeoxycholic acid (CDCA), a blocking layer, and the use of a co-sensitization process resulted in an increase in the final efficiency to a value of 8.50%.
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Autorzy i Afiliacje

Paweł Gnida
1
ORCID: ORCID
Aneta Slodek
2
ORCID: ORCID
Mieczysław Łapkowski
1 3 4
ORCID: ORCID
Ewa Schab-Balcerzak
1 2
ORCID: ORCID

  1. Centre of Polymer and Carbon Materials, Polish Academy of Sciences, 34 M. Curie-Sklodowskiej Str., 41-819 Zabrze, Poland
  2. Institute of Chemistry, University of Silesia, 9 Szkolna Str., 40-006 Katowice, Poland
  3. Faculty of Chemistry, Silesian University of Technology, 9 M. Strzody Str, 44-100 Gliwice, Poland
  4. Centre for Organic and Nanohybrid Electronics, Silesian University of Technology, 22b Konarskiego Str., 44-100 Gliwice, Poland

Abstrakt

This article introduces a zinc metal layer structure integrated into a standard photovoltaic (PV) module, potentially serving a double purpose: as a light reflecting and re-directing diffuser, increasing the PV module overall efficiency, offering anodic protection of Ag/Sn interface against corrosion within the PV module structure. The ethylene-vinyl acetate (EVA) cross-linking degree and peel force measurements were carried out to check the quality of the encapsulation process for the modified modules. Finally, the electrical series resistance of PV modules was measured showing that the modified PV module almost maintained its initial series resistance after exposure to damp-heat conditions of 85 °C, 85% relative humidity for 1000 h, while the unmodified PV module increased its resistance by 5% under the same conditions.
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Autorzy i Afiliacje

Olgierd Jeremiasz
1 2
ORCID: ORCID
Grażyna Kulesza-Matlak
1
ORCID: ORCID
Piotr Sobik
2
ORCID: ORCID
Paweł Nowak
2
ORCID: ORCID
Klaudiusz Grübel
3
Kazimierz Drabczyk
1 3
ORCID: ORCID

  1. Institute of Metallurgy and Materials Science, Polish Academy of Sciences, ul. Reymonta 25, 30-059 Kraków, Poland
  2. Helioenergia sp. z o. o., ul. Rybnicka 68, 44-238 Czerwionka-Leszczyny, Poland
  3. University of Bielsko-Biala, ul. Willowa 2, 43-309 Bielsko-Biała, Poland

Abstrakt

A dual-wavelength high-accuracy universal polarimeter was applied to the circular birefringence and optical activity measurement in potassium titanyl phosphate (KTP) nonlinear crystal. The experimental setup used two single-mode He-Ne lasers with close wavelengths of 594 and 633 nm as light sources. Measurement has been carried out for two crystal settings in directions of a 45-degree relative angle to the [100] and [010] crystallographic axes. Multiple light reflections inside the crystal sample were considered when processing the results of the polarimetric measurements. The results have been analysed using the optical transmission function for the polariser-sample-analyser system, and 2D intensity contour maps made it possible to determine the phase parameters, systematic errors, and eigenwaves ellipticity. It was found that the gyration tensor component of the KTP crystal is equal to g12 = 1.4 ⋅ 10−5 which in terms of optical rotatory power corresponds to the very small magnitude of the rotation value of 2.3 deg/mm.
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Autorzy i Afiliacje

Mykola Shopa
1
ORCID: ORCID
Nazar Ftomyn
2
ORCID: ORCID
Yaroslav Shopa
3
ORCID: ORCID

  1. Department of Atomic, Molecular and Optical Physics, Gdańsk University of Technology, ul. Narutowicza 11/12, Gdańsk 80-233, Poland
  2. Faculty of Physics, Ivan Franko National University of Lviv, Kyrylo & Mephodiy 8, Lviv 79005, Ukraine
  3. Faculty of Mathematics and Natural Sciences, Cardinal Stefan Wyszynski University in Warsaw, ul. Wóycickiego 1/3, Warsaw 01-938, Poland

Instrukcja dla autorów

Guide for Authors

https://www.editorialsystem.com/opelre/journal/for_authors/

OPTO-ELECTRONICS REVIEW is an open access journal. This involves the payment of an article publishing charge (APC) by the authors, their institution or funding body. We make the article freely available immediately upon publication on PAS Jornals platform (https://journals.pan.pl/opelre)

As of July 1st, 2024, there are changes in the fees for open access publications in Opto-Electronics Review: 2000 PLN (500 EUR) - up to 8 pages of the journal format and mandatory over-length charges of 200 PLN (50 EUR) per page (see the above link with instructions for Authors for details)

Articles submitted by June 30th, 2024: existing fee: 1750 PLN (or 400 EUR)

Articles submitted from July 1st, 2024: new fee: 2000 PLN (or 500 EUR) - a flat fee per paper up to 8 pages of the journal format (each additional page will be charged an additional 200 PLN or 50 EUR).

Dodatkowe informacje

barwy Rzeczypospolitej Polskiej i wizerunek godła Rzeczypospolitej Polskiej

DOFINANSOWANO ZE ŚRODKÓW BUDŻETU PAŃSTWA
Rozwój czasopism naukowych
Nr projektu: RCN/SN/0652/2021/1
Dofinansowanie: 85 700 zł
Całkowita wartość: 85 700 zł
Data podpisania umowy: 6 grudnia 2022 r.
Celem projektu jest wsparcie działalności wydawniczej Opto-Electronics Review w zakresie poprawy widoczności czasopisma na arenie krajowej i międzynarodowej oraz podwyższenia jakości edytorskiej prezentowanych treści.

CO-FINANCED FROM THE STATE BUDGET
Development of scientific journals
Project number: RCN/SN/0652/2021/1
Funding: PLN 85,700
Total value: PLN 85,700
Date of signing the contract: December 6, 2022.
The project aims to support the publishing activities of Opto-Electronics Review to improve the journal's visibility in the national and international arena and increase the editorial quality of the presented content.

Opto-Electronics Review was established in 1992 for the publication of scientific papers concerning optoelectronics and photonics materials, system and signal processing. This journal covers the whole field of theory, experimental verification, techniques and instrumentation and brings together, within one journal, contributions from a wide range of disciplines. Papers covering novel topics extending the frontiers in optoelectronics and photonics are very encouraged. The main goal of this magazine is promotion of papers presented by European scientific teams, especially those submitted by important team from Central and Eastern Europe. However, contributions from other parts of the world are by no means excluded.

Articles are published in OPELRE in the following categories:

-invited reviews presenting the current state of the knowledge,

-specialized topics at the forefront of optoelectronics and photonics and their applications,

-refereed research contributions reporting on original scientific or technological achievements,

-conference papers printed in normal issues as invited or contributed papers.

Authors of review papers are encouraged to write articles of relevance to a wide readership including both those established in this field of research and non-specialists working in related areas. Papers considered as “letters” are not published in OPELRE.

Opto-Electronics Review is published quarterly as a journal of the Association of Polish Electrical Engineers (SEP) and Polish Academy of Sciences (PAS) in cooperation with the Military University of Technology and under the auspices of the Polish Optoelectronics Committee of SEP.

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The editors of the journal place particular emphasis on compliance with the following principles:

Ethical policy of Opto-Electronics Review

The ethical policy of Opto-Electronics Review follows the European Code of Conduct for Research Integrity and is also guided by the core practices and policies outlined by the Committee on Publication Ethics (COPE).

Authors must be honest in presenting their results and conclusions of their research. Research misconduct is harmful for knowledge.

Research results

Fabrication, falsification, or selective reporting of data with the intent to mislead or deceive is unethical, as is the theft of data or research results from others. The results of research should be recorded and maintained to allow for analysis and review. Following publication, the data should be retained for a reasonable period and made available upon request. Exceptions may be appropriate in certain circumstances to preserve privacy, to assure patent protection, or for similar reasons.

Authorship

All those who have made a significant contribution should be given chance to be cited as authors. Other individuals who have contributed to the work should be acknowledged. Articles should include a full list of the current institutional affiliations of all authors, both academic and corporate.

Competing interests

All authors, referees and editors must declare any conflicting or competing interests relating to a given article. Competing interests through their potential influence on behavior or content or perception may undermine the objectivity, integrity, or perceived value of publication.

Peer Review

We are committed to prompt evaluation and publication of fully accepted papers in Opto-Electronics Review’s publications. To maintain a high-quality publication, all submissions undergo a rigorous review process.

Characteristics of the peer review process are as follows:

• Simultaneous submissions of the same manuscript to different journals will not be tolerated.

• Manuscripts with contents outside the scope will not be considered for review.

• Opto-Electronics Review is a single-blind review journal.

• Papers will be refereed by at least 2 experts as suggested by the editorial board.

• In addition, Editors will have the option of seeking additional reviews when needed. Authors will be informed when Editors decide further review is required.

• All publication decisions are made by the journal’s Editor-in-Chief based on the referees’ reports. Authors of papers that are not accepted are notified promptly.

• All submitted manuscripts are treated as confidential documents. We expect reviewers to treat manuscripts as confidential material.

• Editors and reviewers involved in the review process should disclose conflicts of interest resulting from direct competitive, collaborative, or other relationships with any of the authors, and remove oneself from cases in which such conflicts preclude an objective evaluation. Privileged information or ideas that are obtained through peer review must not be used for competitive gain.

• A reviewer should be alert to potential ethical issues in the paper and should bring these to the attention of the editor, including any substantial similarity or overlap between the manuscript under consideration and any other published paper of which the reviewer has personal knowledge. Any statement, observation, derivation, or argument that had been previously reported should be accompanied by the relevant citation.

• Personal criticism is inappropriate.

Plagiarism

Reproducing text from other papers without properly crediting the source (plagiarism) or producing many papers with almost the same content by the same authors (self-plagiarism) is not acceptable. Submitting the same results to more than one journal concurrently is unethical. Exceptions are the review articles. Authors may not present results obtained by others as if they were their own. Authors should acknowledge the work of others used in their research and cite publications that have influenced the direction and course of their study.

Plagiarism is not tolerated. All manuscripts submitted to Opto-Electronics Review will be checked for plagiarism (copying text or results from other sources) and self-plagiarism (duplicating substantial parts of authors’ own published work without giving the appropriate references) using the CrossCheck database (iThenticate plagiarism checker).

Duplicate submission

Simultaneous submissions of the same manuscript to different journals will not be tolerated. The submitted article will be removed without consideration.

Corrections and retractions

All authors have an obligation to inform and cooperate with journal editors to provide prompt retractions or correction of errors in published works.

• The journal will issue retractions if:

• There is clear evidence that the findings are unreliable, either as a result of misconduct (e.g., data fabrication or honest error - miscalculation or experimental error);

• The findings have previously been published elsewhere without proper cross-referencing, permission or justification (i.e., cases of redundant publication);

• It constitutes plagiarism;

• It reports unethical research.

• The journal will issue errata, if:

• A small portion of an otherwise reliable publication proves to be misleading (especially because of honest error);

• The author list is incorrect.

Other forms of misconduct include failure to meet clear ethical and legal requirements such as misrepresentation of interests, breach of confidentiality, lack of informed consent and abuse of research subjects or materials. Misconduct also includes improper dealing with infringements, such as attempts to cover up misconduct and reprisals on whistleblowers.

The primary responsibility for handling research misconduct is in the hands of those who employ the researchers. If a possible misconduct is brought to our attention, we will seek advice from the referees and the Editorial Board. If there is the evidence, we will resolve the matter by appropriate corrections in the printed and online journal; by refusing to consider an author's future work and by contacting affected authors and editors of other journals.

Human and Animal Rights

If the work involves the use of human subjects, the author should ensure that the work described has been carried out in accordance with The Code of Ethics of the World Medical Association (Declaration of Helsinki) for experiments involving humans; Uniform Requirements for manuscripts submitted to Biomedical journals. Authors should include a statement in the manuscript that informed consent was obtained for experimentation with human subjects. The privacy rights of human subjects must always be observed.

All animal experiments should comply with the ARRIVE guidelines and should be carried out in accordance with the EU Directive 2010/63/EU for animal experiments, and the authors should clearly indicate in the manuscript that such guidelines have been followed.

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